CHARACTERIZATION OF DIFFUSION PROCESS IN OXIDE GLASSES BASED ON CORRELATION BETWEEN ELECTRIC CONDUCTION AND DIELECTRIC-RELAXATION

被引:322
作者
NAMIKAWA, H [1 ]
机构
[1] ELECTROTECH LAB,MAT DIV,TANASHI,TOKYO,JAPAN
关键词
D O I
10.1016/0022-3093(75)90019-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:173 / 195
页数:23
相关论文
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