CHARACTERIZATION OF DIFFUSION PROCESS IN OXIDE GLASSES BASED ON CORRELATION BETWEEN ELECTRIC CONDUCTION AND DIELECTRIC-RELAXATION

被引：322

作者：

NAMIKAWA, H ^{[1
]}

机构：

[1] ELECTROTECH LAB,MAT DIV,TANASHI,TOKYO,JAPAN

来源：

关键词：

D O I：

10.1016/0022-3093(75)90019-8

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：173 / 195

页数：23

共 28 条

[21] SAITO S, 1965, 3RD P S BAS CER, P122
[22] INTERNAL FRICTION OF MIXED-ALKALI SILICATE GLASSES
STEINKAMP, WE
SHELBY, JE
DAY, DE
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1967, 50 (05) : 271 - +
[23] Stevels J.M, 1957, HDB PHYS, P350
[24] TAYLOR HE, 1957, J SOC GLASS TECHNOL, V41, pT350
[25] TAYLOR HE, 1959, J SOC GLASS TECHNOL, V43, pT124, DOI DOI 10.1088/0034-4885/72/4/046501
[26] TSUCHIYA T, 1974, YOGYO KYOKAI SHI, V82, P147
[27] WAKAI Y, 1972, 12TH P S GLASS DIV T, P41
[28] Yamamoto K., 1974, Yogyo-Kyokai-Shi, V82, P538, DOI 10.2109/jcersj1950.82.950_538