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ON THE THEORY OF CARRIER NUMBER FLUCTUATIONS IN MOS DEVICES

被引：95
作者：
GHIBAUDO, G
机构：
来源：
SOLID-STATE ELECTRONICS | 1989年 / 32卷 / 07期
关键词：
D O I：
10.1016/0038-1101(89)90113-5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：563 / 565
页数：3
相关论文
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[7]   UNIFIED PRESENTATION OF 1/F NOISE IN ELECTRONIC DEVICES - FUNDAMENTAL 1/F NOISE SOURCES [J].
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