ELECTRONIC STATES AND THICKNESSES OF GAAS/GAALAS QUANTUM WELLS AS MEASURED BY ELECTROREFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY

被引：59

作者：

ERMAN, M ^{[1
]}

THEETEN, JB ^{[1
]}

FRIJLINK, P ^{[1
]}

GAILLARD, S ^{[1
]}

HIA, FJ ^{[1
]}

ALIBERT, C ^{[1
]}

机构：

[1] UNIV SCI & TECH LANGUEDOC EM,F-34060 MONTPELLIER,FRANCE

来源：

关键词：

D O I：

10.1063/1.333843

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3241 / 3249

页数：9

共 19 条

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