THE VARIANCE AS A MEASURE OF LINE BROADENING - CORRECTIONS FOR TRUNCATION, CURVATURE AND INSTRUMENTAL EFFECTS

[1] Anantharaman T.R., 1966, P INDIAN ACAD SCI SE, VVolume 64, P261

[2] AUFFREDIC JP, 1980, 9TH P INT S REACT SO, P590

[3] APPLICATION OF TRUNCATED INTEGRATED INTENSITY TO ANALYSIS OF BROADENED X-RAY DIFFRACTION LINES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (APR1) : 57 - &

[4] ETUDES DE LA STRUCTURE DE RAIES DE DIFFRACTION DES RAYONS X PAR DES COUCHES MINCES DOR [J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (APR): : 424 - &

[5] Edwards H. J., 1970, Journal of Applied Crystallography, V3, P165, DOI 10.1107/S0021889870005861

[6] COMPARISON BETWEEN VARIANCES OF CU K-ALPHA AND FE K-ALPHA SPECTRAL DISTRIBUTIONS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (FEB1) : 43 - &

[7] NON-ADDITIVITY AND CURVATURE CORRECTIONS IN VARIANCE METHOD OF X-RAY LINE-BROADENING ANALYSIS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (AUG1) : 319 - &

[8] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd ed.

[9] SCHERRER AFTER 60 YEARS - SURVEY AND SOME NEW RESULTS IN DETERMINATION OF CRYSTALLITE SIZE [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (APR) : 102 - 113

[10] RAPID METHOD FOR ANALYZING BREADTHS OF DIFFRACTION AND SPECTRAL-LINES USING VOIGT FUNCTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) : 10 - 14

[1] Anantharaman T.R., 1966, P INDIAN ACAD SCI SE, VVolume 64, P261

[2] AUFFREDIC JP, 1980, 9TH P INT S REACT SO, P590

[3] APPLICATION OF TRUNCATED INTEGRATED INTENSITY TO ANALYSIS OF BROADENED X-RAY DIFFRACTION LINES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (APR1) : 57 - &

[4] ETUDES DE LA STRUCTURE DE RAIES DE DIFFRACTION DES RAYONS X PAR DES COUCHES MINCES DOR [J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (APR): : 424 - &

[5] Edwards H. J., 1970, Journal of Applied Crystallography, V3, P165, DOI 10.1107/S0021889870005861

[6] COMPARISON BETWEEN VARIANCES OF CU K-ALPHA AND FE K-ALPHA SPECTRAL DISTRIBUTIONS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (FEB1) : 43 - &

[7] NON-ADDITIVITY AND CURVATURE CORRECTIONS IN VARIANCE METHOD OF X-RAY LINE-BROADENING ANALYSIS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (AUG1) : 319 - &

[8] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd ed.

[9] SCHERRER AFTER 60 YEARS - SURVEY AND SOME NEW RESULTS IN DETERMINATION OF CRYSTALLITE SIZE [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (APR) : 102 - 113

[10] RAPID METHOD FOR ANALYZING BREADTHS OF DIFFRACTION AND SPECTRAL-LINES USING VOIGT FUNCTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) : 10 - 14