CALCULATION OF X-RAY-FLUORESCENCE INTENSITIES FROM BULK AND MULTILAYER SAMPLES

被引：81

作者：

DEBOER, DKG

机构：

[1] Philips Research Laboratories, Eindhoven, 5600 JA

来源：

X-RAY SPECTROMETRY | 1990年 / 19卷 / 03期

关键词：

D O I：

10.1002/xrs.1300190312

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Equations are derived for the calculation of x‐ray fluorescence intensities from bulk and multilayer samples. Both intra‐ and interlayer secondary fluorescence intensities are expressed analytically, in terms of the exponential‐integral function. It is shown that calculations are performed much faster with this method than with a previous method using numerical integration. As an illustration, some examples of intensity calculations are given for a thin layer on a substrate. Copyright © 1990 John Wiley & Sons, Ltd.

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页码：145 / 154

页数：10

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