X-RAY AND OPTICAL CHARACTERIZATION OF 3 GROWTH MORPHOLOGIES OF CVD DIAMOND FILMS

被引:10
作者
SPECHT, ED
CLAUSING, RE
HEATHERLY, L
机构
[1] Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge
关键词
D O I
10.1016/0022-0248(91)90676-V
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Using X-ray texture measurements and optical goniometry, we have determined the texture and facet orientation of diamond films grown by CVD with three distinct morphologies. The first morphology has {111} and {100} facets and a <110> texture which is attributed to preferential growth as the result of rapid nucleation of atomic layers at {111} twin boundaries. The second morphology has {100} facets and a <1730> texture which may be due to the influence of surface diffusion on growth competition. The third morphology has {111} facets and a <100> texture which is attributed to competition of uniformly growing grains.
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页码:38 / 46
页数:9
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