TOWARD QUANTIFICATION OF THIN-FILM MORPHOLOGY

[1] STUDIES OF SURFACE, THIN-FILM AND INTERFACE PROPERTIES BY AUTOMATIC SPECTROSCOPIC ELLIPSOMETRY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02): : 289 - 295

[2] MULTIPLE ANALYSIS OF AN UNKNOWN OPTICAL MULTILAYER COATING [J]. APPLIED OPTICS, 1985, 24 (16) : 2625 - 2646

[3] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61

[4] BLANCO JR, 1985, THESIS PENNSYLVANIA

[5] BLANCO JR, 1985, MATER RES SOC S P, V38, P301

[6] RECONSTRUCTION OF 3 DIMENSIONAL STRUCTURES FROM ELECTRON MICROGRAPHS [J]. NATURE, 1968, 217 (5124) : 130 - &

[7] COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS [J]. THIN SOLID FILMS, 1977, 47 (03) : 219 - 233

[8] Giri A. P., 1984, MATER RES SOC S P, V24, P221

[9] GUENTHER KH, 1982, P SPIE, V246, P9

[10] SIMULATION OF STRUCTURAL ANISOTROPY AND VOID FORMATION IN AMORPHOUS THIN-FILMS [J]. APPLIED PHYSICS LETTERS, 1974, 25 (11) : 641 - 643

[1] STUDIES OF SURFACE, THIN-FILM AND INTERFACE PROPERTIES BY AUTOMATIC SPECTROSCOPIC ELLIPSOMETRY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02): : 289 - 295

[2] MULTIPLE ANALYSIS OF AN UNKNOWN OPTICAL MULTILAYER COATING [J]. APPLIED OPTICS, 1985, 24 (16) : 2625 - 2646

[3] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61

[4] BLANCO JR, 1985, THESIS PENNSYLVANIA

[5] BLANCO JR, 1985, MATER RES SOC S P, V38, P301

[6] RECONSTRUCTION OF 3 DIMENSIONAL STRUCTURES FROM ELECTRON MICROGRAPHS [J]. NATURE, 1968, 217 (5124) : 130 - &

[7] COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS [J]. THIN SOLID FILMS, 1977, 47 (03) : 219 - 233

[8] Giri A. P., 1984, MATER RES SOC S P, V24, P221

[9] GUENTHER KH, 1982, P SPIE, V246, P9

[10] SIMULATION OF STRUCTURAL ANISOTROPY AND VOID FORMATION IN AMORPHOUS THIN-FILMS [J]. APPLIED PHYSICS LETTERS, 1974, 25 (11) : 641 - 643