AN ABSOLUTE MEASUREMENT OF OPTICAL REFLECTIVITY BY MODIFICATION OF A WMS SYSTEM

被引:3
作者
SHAW, SY
LUE, JT
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 10期
关键词
D O I
10.1088/0022-3735/14/10/006
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1135 / 1136
页数:2
相关论文
共 5 条
[1]   WAVELENGTH-MODULATING SPECTROMETER IMPLEMENTED WITH PHOTO-VOLTAIC PHOTO-DIODES [J].
LUE, JT .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (09) :833-836
[2]   OPTICAL CONSTANTS OF SILICON IN THE REGION 1 TO 10 EV [J].
PHILIPP, HR ;
TAFT, EA .
PHYSICAL REVIEW, 1960, 120 (01) :37-38
[3]   INFRARED REFRACTIVE INDEXES OF SILICON GERMANIUM AND MODIFIED SELENIUM GLASS [J].
SALZBERG, CD ;
VILLA, JJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (03) :244-246
[4]   A DOUBLE-BEAM SINGLE-DETECTOR WAVELENGTH-MODULATING SPECTROMETER ACCOMPLISHED WITH ELECTRONIC AUTOMATIC GAIN-CONTROL [J].
SHAW, SY ;
LUE, JT .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (08) :845-847
[5]  
1978, APPLICATION CA3080 H