SURFACE AND ADSORBATE STRUCTURAL-ANALYSIS FROM TIME-OF-FLIGHT SCATTERING AND RECOILING SPECTROMETRY (TOF-SARS)

The methods of obtaining surface structural information from low energy ion scattering spectrometry are described. These methods include measurements of backscattering, forwardscattering, and recoiling intensities vs beam incident alpha, beam exit beta, crystal azimuthal delta, and scattering THETA-angles. References are provided which give examples of each different kind of measurement. The technique of time-of-flight scattering and recoiling spectrometry (TOF-SARS), which collects both scattered.and recoiled neutrals and ions simultaneously, is described. TOF-SARS data for the three surface phases, clean Ni{110}-(1 x 1), Ni{110}-(1 x 2)-H missing row, and Ni{110}-(2 x 1)-O missing row, are used to illustrate some of the structural measurements.