ATOMIC-SCALE IMAGES OF THE GROWTH SURFACE OF CA1-XSRXCUO2 THIN-FILMS

被引：29

作者：

KOGUCHI, K ^{[1
]}

MATSUMOTO, T ^{[1
]}

KAWAI, T ^{[1
]}

机构：

[1] OSAKA UNIV, INST SCI & IND RES, IBARAKI, OSAKA 567, JAPAN

来源：

SCIENCE | 1995年 / 267卷 / 5194期

关键词：

D O I：

10.1126/science.267.5194.71

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

The surface microstructure of c-axis (Ca,Sr)CuO2 thin films, grown by laser molecular beam epitaxy on SrTiO3(001) substrates, was studied by ultrahigh-vacuum scanning tunneling microscopy (STM). Images were obtained for codeposited Ca1-xSrxCuO2 thin films, which show a layered-type growth mode, The surfaces consist of atomically flat terraces separated by steps that are one unit cell high. A pronounced dependence of the growth mechanism on the Sr/Ca ratio of the films was observed. Atomic resolution STM images of the CuO2 sheets in the ab plane show a square lattice with an in-plane spacing of 4 angstroms; the lattice contains different concentrations of point defects, depending on the polarity of the sample-tip bias.

引用

页码：71 / 73

页数：3

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