EXPERIMENTAL CONSIDERATIONS IN THE QUEST FOR A THIN-FILM SUPERCONDUCTING FIELD-EFFECT TRANSISTOR

被引：34

作者：

HEBARD, AF

FIORY, AT

EICK, RH

机构：

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1987年 / 23卷 / 02期

关键词：

D O I：

10.1109/TMAG.1987.1065058

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1279 / 1282

页数：4

共 12 条

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[8] DIVERGING CHARACTERISTIC LENGTHS AT CRITICAL DISORDER IN THIN-FILM SUPERCONDUCTORS [J].

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[9]

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[10] PHYSICAL CONCEPTS OF HIGH-FIELD, THIN-FILM ELECTRO-LUMINESCENCE DEVICES [J].

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