MICROWAVE HALL MEASUREMENT TECHNIQUES ON LOW MOBILITY SEMICONDUCTORS AND INSULATORS .1. ANALYSIS

被引：23

作者：

SAYED, MM ^{[1
]}

WESTGATE, CR ^{[1
]}

机构：

[1] JOHNS HOPKINS UNIV, ELECT ENGN DEPT, BALTIMORE, MD 21218 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1975年 / 46卷 / 08期

关键词：

D O I：

10.1063/1.1134404

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1074 / 1079

页数：6

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