PURITY EXAMINATION OF SILICON AND GERMANIUM HALIDES BY LONG-PATH INFRARED SPECTROPHOTOMETRY

被引：13

作者：

RAND, MJ

机构：

来源：

ANALYTICAL CHEMISTRY | 1963年 / 35卷 / 13期

关键词：

D O I：

10.1021/ac60206a043

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2126 / +

页数：1

共 35 条

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