OPTICAL SYSTEMS FOR OBSERVING SURFACE TOPOGRAPHY BY FRUSTRATED TOTAL INTERNAL REFLECTION + BY INTERFERENCE

被引：29

作者：

MCCUTCHEN, CW

机构：

来源：

关键词：

D O I：

10.1063/1.1718740

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1340 / &

共 10 条

[1] PENETRATION OF MICROWAVES INTO THE RARER MEDIUM IN TOTAL REFLECTION
BRADY, JJ
BRICK, RO
PEARSON, MD
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (11) : 1080 - 1084
[2] BURCH CR, 1947, P PHYS SOC LOND, V59, P41, DOI 10.1088/0959-5309/59/1/308
[3] DREYHAUPT W, 1939, WERKSTATTSTECHNIK WE, V33, P321
[4] DYSON J, 1949, P PHYS SOC LOND, V62, P565
[5] The penetration of totally reflected light into the rarer medium
Hall, EE
[J]. PHYSICAL REVIEW, 1902, 15 (02): : 73 - 106
[6] USE OF FRUSTRATED TOTAL INTERNAL REFLECTION TO MEASURE FILM THICKNESS AND SURFACE RELIEFS
HARRICK, NJ
[J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (09) : 2774 - &
[7] GENERALIZED APERTURE + 3-DIMENSIONAL DIFFRACTION IMAGE
MCCUTCHEN, CW
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (02) : 240 - &
[8] REFRACTOMETER MICROSCOPE
MCCUTCHEN, CW
[J]. APPLIED OPTICS, 1962, 1 (03): : 253 - 259
[9] SCHMALTZ G, 1936, TECHNISCHE OBERFLACH
[10] YOUNG TR, 1963, J RES NATL BUR STD A, VA 67