AL L2,3 CORE EXCITONS IN ALXGA1-XAS STUDIED BY SOFT-X-RAY REFLECTION AND EMISSION

被引：4

作者：

DONG, QY ^{[1
]}

OBRIEN, WL ^{[1
]}

JIA, JJ ^{[1
]}

CALLCOTT, TA ^{[1
]}

MUELLER, DR ^{[1
]}

EDERER, DL ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL,GAITHERSBURG,MD 20899

来源：

PHYSICAL REVIEW B | 1992年 / 46卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.46.15116

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The Al L2,3 soft-x-ray reflection and emission spectra of AlxGa1-xAs have been measured for x between 0.17 and 1.O. The valence-band maximum was monitored via the emission spectra using a fit based on band-structure parameters. The dominant features in the reflection spectra are produced by the L2,3 core excitons. Since both the reflection spectra and emission spectra were obtained using the same soft-x-ray spectrometer, the energies of the excitons above the valence-band maximum are accurately obtained. The known values of the optical band gap, as a function of x, are then used to determine the core exciton binding energy. The core excitons are found to follow and lie above the conduction-band minimum by 0.3 eV as the Al composition changes. Our results are compared to various core exciton theories and to previous experiments.

引用

页码：15116 / 15122

页数：7

共 17 条

[1] GAAS, ALAS, AND ALXGA1-XAS - MATERIAL PARAMETERS FOR USE IN RESEARCH AND DEVICE APPLICATIONS [J].