X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A STRUCTURAL PROBE FOR STUDYING ULTRATHIN EPITAXIAL-FILMS AND INTERFACES

被引：9

作者：

EGELHOFF, WF

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 03期

关键词：

D O I：

10.1116/1.573805

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：758 / 759

页数：2

共 31 条

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