QUANTITATIVE CHARACTERIZATION OF ABRUPT INTERFACES BY ANGLE-RESOLVED AUGER-ELECTRON EMISSION

被引：21

作者：

CHAMBERS, SA

GREENLEE, TR

SMITH, CP

WEAVER, JH

机构：

[1] BETHEL COLL,DEPT PHYS,ST PAUL,MN 55112

[2] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

来源：

PHYSICAL REVIEW B | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.32.4245

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：4245 / 4248

页数：4

共 10 条

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[7] AZIMUTHAL ANISOTROPY IN CORE-LEVEL X-RAY PHOTOEMISSION FROM C(2X2) OXYGEN ON CU(001) - EXPERIMENT AND SINGLE-SCATTERING THEORY [J].

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[8]

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[9] FOCUSING AND DIFFRACTION EFFECTS IN ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

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[10]

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