REFRACTIVE-INDEXES OF POWDERED MATERIALS AND MATERIALS WITH NONSPECULARLY REFLECTING SURFACES - SIMPLE METHOD OF DETERMINATION

被引：3

作者：

SPITZER, D ^{[1
]}

机构：

[1] UNIV GRONINGEN, LAB MAT TECH, GRONINGEN, NETHERLANDS

来源：

关键词：

D O I：

10.1364/AO.14.001489

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1489 / 1491

页数：3

共 8 条

[1] REFRACTIVE-INDEX DETERMINATION OF LAYERED COMPOUND ZNLN2S4 [J].

ANEDDA, A .

APPLIED OPTICS, 1974, 13 (07) :1595-1598

[2]

BIJVOET JM, 1951, XRAY ANALYSIS CRYSTA, P28

[3] EFFECT OF THIN-FILM THICKNESS ON ABELES-TYPE INDEX MEASUREMENTS [J].

BURNS, WK ;

LEE, AB .

[4]

GARBUNY M, 1965, OPTICAL PHYSICS, P240

[5] REFLECTION FROM A PERIODIC DIELECTRIC SURFACE [J].

NELSON, HF ;

GOULARD, R .

SPITZER, D ;

TENBOSCH, JJ .

CALCIFIED TISSUE RESEARCH, 1975, 17 (02) :129-137

[7]

WAHLSTROM EE, 1956, OPTICAL CRYSTALLOGRA, P55

[8]

WEAST DC, 1970, HDB CHEMISTRY PHYSIC, pE233