PREDICTION OF AUGER PEAK INTENSITIES FROM OVERLAYER STRUCTURES

被引：10

作者：

DOBSON, PJ

REGAN, BJ

机构：

[1] IMPERIAL COLL SCI & TECHNOL,BLACKETT LAB,LONDON SW7 2BZ,ENGLAND

[2] IMPERIAL COLL SCI & TECHNOL,DEPT CHEM,LONDON SW7 2AZ,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1976年 / 9卷 / 08期

关键词：

D O I：

10.1088/0022-3735/9/8/027

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：694 / 695

页数：2

相关论文

共 7 条

[1] Abramowitz M., 1965, HDB MATH FUNCTIONS F, P228
[2] A SIMPLE MODEL FOR DEPENDENCE OF AUGER INTENSITIES ON SPECIMEN THICKNESS
GALLON, TE
[J]. SURFACE SCIENCE, 1969, 17 (02) : 486 - &
[3] ANGULAR DEPENDENCE OF AUGER-ELECTRON EMISSION FROM A SINGLE-CRYSTAL SPECIMEN
MCDONNELL, L
WOODRUFF, DP
[J]. VACUUM, 1972, 22 (10) : 477 - 480
[4] ATTENUATION LENGTHS OF LOW-ENERGY ELECTRONS IN SOLIDS
POWELL, CJ
[J]. SURFACE SCIENCE, 1974, 44 (01) : 29 - 46
[5] DISTINCTION BETWEEN ADSORBED MONOLAYERS AND THICKER LAYERS IN AUGER-ELECTRON SPECTROSCOPY
SEAH, MP
[J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1973, 3 (08): : 1538 - 1547
[6] ORIENTATION DEPENDENCE OF OVERLAYER ATTENUATION OF ELECTRONS FOR CYLINDRICAL MIRROR ANALYZER AND A RETARDING FIELD ANALYZER
SHELTON, JC
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (06) : 417 - 425
[7] ESCAPE LENGTH OF AUGER ELECTRONS
TARNG, ML
WEHNER, GK
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (04) : 1534 - 1540