ANALYTICAL FUNCTIONS FOR FITTING K X-RAY DOUBLET PEAKS FROM SI(LI) DETECTORS

被引：10

作者：

WATANABE, Y ^{[1
]}

KUBOZOE, T ^{[1
]}

MUKOYAMA, T ^{[1
]}

机构：

[1] KYOTO UNIV HOSP,INST CHEM RES,KYOTO 606,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 17卷 / 01期

关键词：

D O I：

10.1016/0168-583X(86)90456-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：81 / 85

页数：5

共 18 条

[1]

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[8]

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[9] ANALYTIC APPROXIMATIONS TO PEAK SHAPES PRODUCED BY GE(LI) AND SI(LI) SPECTROMETERS [J].

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NUCLEAR INSTRUMENTS & METHODS, 1975, 127 (01) :73-81

[10] AUTOMATIC-ANALYSIS OF GAMMA-RAY SPECTRA FROM GERMANIUM DETECTORS [J].

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NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03) :525-536

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