RESOLUTION IN SOFT-X-RAY MICROSCOPES

被引:55
作者
JACOBSEN, C
KIRZ, J
WILLIAMS, S
机构
[1] Department of Physics, State Univesity of New York at Stony Brook, Stony Brook
基金
美国国家科学基金会;
关键词
D O I
10.1016/0304-3991(92)90185-M
中图分类号
TH742 [显微镜];
学科分类号
摘要
X-ray microscopes are able to image thick, wet biological specimens at 50 nm or better resolution, to perform elemental analysis at 0.1-10 mum resolution with as high as ppm sensitivity, and to analyze surface composition at 0.1-1 mum resolution. We concentrate here on the use of soft X-rays, where the wavelength is typically > 1 nm, although mention of some techniques and results at shorter wavelengths is also made. We discuss the physical principles behind X-ray microscopes, the types of optical systems used and their achievable resolution, resolution limitations imposed by radiation damage, and recent application of X-ray microscopes to the imaging of biological, materials science, geological, and other specimens.
引用
收藏
页码:55 / 79
页数:25
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