BACKGROUND SUBTRACTION IN ELECTRON-SPECTROSCOPY BY USE OF REFLECTION ELECTRON-ENERGY LOSS SPECTRA

被引：15

作者：

CHORKENDORFF, I

TOUGAARD, S

机构：

[1] Odense Univ, Odense, Den, Odense Univ, Odense, Den

来源：

APPLIED SURFACE SCIENCE | 1987年 / 29卷 / 01期

关键词：

ELECTRONS - Reflection - SIGNAL FILTERING AND PREDICTION;

D O I：

10.1016/0169-4332(87)90018-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The use of reflected electron energy loss spectra (REELS) in deconvoluting the inelastic background signal from XPS and AES spectra from homogeneous samples is studied. It is demonstrated that under certain assumptions, the cross section for inelastic electron scattering can be extracted from a REELS spectrum. This cross section is applied to deconvolute an experimental XPS spectrum of aluminum. The method, its limitations and its relation to other methods are discussed.

引用

页码：101 / 112

页数：12

共 24 条

[1] DATA ACQUISITION AND PROCESSING MODES FOR QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY
BURRELL, MC
KALLER, RS
ARMSTRONG, NR
[J]. ANALYTICAL CHEMISTRY, 1982, 54 (14) : 2511 - 2517
[2] A SEQUENTIAL METHOD FOR REMOVING THE INELASTIC LOSS CONTRIBUTION FROM AUGER-ELECTRON SPECTROSCOPIC DATA
BURRELL, MC
ARMSTRONG, NR
[J]. APPLICATIONS OF SURFACE SCIENCE, 1983, 17 (01): : 53 - 69
[3] CARLEY AF, 1976, J ELECTRON SPECTROSC, V16, P1
[4] HIGH-ENERGY AND LOW-ENERGY AUGER-ELECTRON TRANSITIONS IN YTTERBIUM AND GOLD - THEORY AND EXPERIMENTS
CHORKENDORFF, I
ONSGAARD, J
[J]. PHYSICAL REVIEW B, 1986, 33 (02): : 937 - 942
[5] LOW-ENERGY AUGER SPECTRUM OF TUNGSTEN
CHORKENDORFF, I
ONSGAARD, J
[J]. PHYSICA SCRIPTA, 1983, T4 : 165 - 168
[6] VALENCE-BAND STRUCTURE IN AUGER SPECTRUM OF ALUMINUM
HOUSTON, JE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 255 - 259
[7] CORRECTION OF DISTORTIONS IN SPECTRAL-LINE PROFILES - APPLICATIONS TO ELECTRON SPECTROSCOPIES
MADDEN, HH
HOUSTON, JE
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (07) : 3071 - 3082
[8] DATA-ANALYSIS TECHNIQUES IN X-RAY PHOTO-ELECTRON SPECTROSCOPY
PROCTOR, A
SHERWOOD, PMA
[J]. ANALYTICAL CHEMISTRY, 1982, 54 (01) : 13 - 19
[9] ELECTRON-EXCITATION AND OPTICAL-POTENTIAL IN ELECTRON-MICROSCOPY
RITCHIE, RH
HOWIE, A
[J]. PHILOSOPHICAL MAGAZINE, 1977, 36 (02): : 463 - 481
[10] Seah M. P., 1980, Surface and Interface Analysis, V2, P222, DOI 10.1002/sia.740020607

← 1 2 3 →