ELECTRON-EXCITATION AND OPTICAL-POTENTIAL IN ELECTRON-MICROSCOPY

被引：372

作者：

RITCHIE, RH

HOWIE, A

机构：

[1] OAK RIDGE NATL LAB,DEPT HLTH PHYS,OAK RIDGE,TN 37830

[2] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

PHILOSOPHICAL MAGAZINE | 1977年 / 36卷 / 02期

关键词：

D O I：

10.1080/14786437708244948

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：463 / 481

页数：19

共 45 条

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[2] BADDE HG, 1972, ELECTRON MICROSCOPY, P440
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[10] DIFFUSE-SCATTERING IN WEAK-BEAM IMAGES
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