RIGOROUS ANALYSIS OF MIXED TRANSMISSION-LINE INTERCONNECTS USING THE FREQUENCY-DOMAIN TLM METHOD

被引：16

作者：

JIN, H ^{[1
]}

VAHLDIECK, R ^{[1
]}

HUANG, JF ^{[1
]}

RUSSER, P ^{[1
]}

机构：

[1] FERDINAND BRAUN INST HOCHFREQUENZTECH, BERLIN, GERMANY

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1993年 / 41卷 / 12期

关键词：

D O I：

10.1109/22.260714

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A rigorous analysis of mixed transmission line interconnects is presented using an improved version of the frequency-domain TLM method. Direct via hole through connections and indirect coupling effects between layered microstrip and coplanar waveguides are investigated as well as the effect of bonding wire transitions between MMIC modules and the microstrip substrate carrier. This investigation is extended to include the abrupt transition from a GaAs-based microstrip line to a rib-type microstrip line, which has not been analyzed before. In the context of this work new developments of the frequency-domain TLM method will be discussed. In particular it will be shown that the transmission line nodes used in the FDTLM can be obtained either by modifying the existing time-domain TLM nodes or directly in the frequency domain. The latter approach leads to a faster algorithm.

引用

页码：2248 / 2255

页数：8

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