SOLUTE EFFECTS ON SOLVENT ELECTROMIGRATION IN DILUTE ALLOYS

被引：17

作者：

DOAN, NV ^{[1
]}

BOCQUET, JL ^{[1
]}

机构：

[1] CEN SACLAY,SECT RECH MET PHYS,BOITE POSTALE 2,GIF SUR YVETTE,FRANCE

来源：

THIN SOLID FILMS | 1975年 / 25卷 / 01期

关键词：

D O I：

10.1016/0040-6090(75)90239-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：15 / 24

页数：10

共 23 条

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[3]

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[7] NEW METHOD OF DETERMINATION OF VACANCY JUMP FREQUENCY RATIOS BY ELECTROMIGRATION IN DILUTE ALLOYS [J].

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[8]

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[9]

DOAN NV, 1971, J PHYS CHEM SOLIDS, V32, P2135

[10] EFFECT OF HIGH ELECTRONIC CURRENT DENSITY ON MOTION OF AU195 AND SB125 IN GOLD [J].

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