X-RAY-EMISSION MEASUREMENTS OF OXYGEN ON (0001) AND (1010) SURFACES OF TELLURIUM

被引：10

作者：

SEWELL, PB ^{[1
]}

MITCHELL, DF ^{[1
]}

机构：

[1] NATL RES COUNCIL CANADA,DIV CHEM,OTTAWA K1A OR9,ONTARIO,CANADA

来源：

关键词：

D O I：

10.1016/0039-6028(76)90397-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：367 / 372

页数：6

共 11 条

[1]

DUTTON WA, 1971, TELLURIUM, P110

[2]

ELAZAB M, TO BE PUBLISHED

[3]

ELAZAB M, 1975, J CRYSTAL GROWTH, V20, P1

FUKUDA, H ;

SAKAI, Y .

[5]

Griffiths C. H., 1969, Proceedings of the International Symposium on the physics of selenium and tellurium, P135

[6]

HERCULES S H, 1972, International Journal of Environmental Analytical Chemistry, V1, P169, DOI 10.1080/03067317208076370

MITCHELL, DF ;

SEWELL, PB .

[8] THE STUDY OF EPITAXY IN THIN SURFACE FILMS [J].

PASHLEY, DW .

SEWELL, PB ;

MITCHELL, DF .

[10]

SEWELL PB, 1972, SURF SCI, V33, P353