FRUSTRATION IN THE SI(111) PSEUDO 5 X 5 CU STRUCTURE DIRECTLY OBSERVED BY SCANNING TUNNELING MICROSCOPY

被引：41

作者：

MORTENSEN, K ^{[1
]}

机构：

[1] AARHUS UNIV,INST PHYS,DK-8000 AARHUS,DENMARK

来源：

PHYSICAL REVIEW LETTERS | 1991年 / 66卷 / 04期

关键词：

D O I：

10.1103/PhysRevLett.66.461

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Frustration in a surface structure has been observed in real space and time using the scanning tunneling microscope. The frustration is revealed as an instability of an inherent feature in the Si(111) "pseudo 5 x 5" Cu structure. A possible origin of the frustration is proposed.

引用

页码：461 / 464

页数：4

共 12 条

[1]

BESENBACHER F, IN PRESS

[2]

Chen D, COMMUNICATION

[3] STRUCTURE AND DYNAMICS OF STRONG CHEMISORPTION ON SI(111) AS MEASURED WITH ATOMIC HELIUM SCATTERING [J].