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IMPROVED EFFICIENCY OF MIS-SILICON SOLAR-CELLS BY HF TREATMENT OF OXIDE LAYER
被引:20
作者
:
KIPPERMAN, AHM
论文数:
0
引用数:
0
h-index:
0
机构:
EINDHOVEN UNIV TECHNOL,DEPT APPL PHYS,MAT SCI GRP,EINDHOVEN,NETHERLANDS
EINDHOVEN UNIV TECHNOL,DEPT APPL PHYS,MAT SCI GRP,EINDHOVEN,NETHERLANDS
KIPPERMAN, AHM
[
1
]
OMAR, MH
论文数:
0
引用数:
0
h-index:
0
机构:
EINDHOVEN UNIV TECHNOL,DEPT APPL PHYS,MAT SCI GRP,EINDHOVEN,NETHERLANDS
EINDHOVEN UNIV TECHNOL,DEPT APPL PHYS,MAT SCI GRP,EINDHOVEN,NETHERLANDS
OMAR, MH
[
1
]
机构
:
[1]
EINDHOVEN UNIV TECHNOL,DEPT APPL PHYS,MAT SCI GRP,EINDHOVEN,NETHERLANDS
来源
:
APPLIED PHYSICS LETTERS
|
1976年
/ 28卷
/ 10期
关键词
:
D O I
:
10.1063/1.88588
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:620 / 621
页数:2
相关论文
共 6 条
[1]
8 PERCENT EFFICIENT LAYERED SCHOTTKY-BARRIER SOLAR CELL
ANDERSON, WA
论文数:
0
引用数:
0
h-index:
0
机构:
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
ANDERSON, WA
DELAHOY, AE
论文数:
0
引用数:
0
h-index:
0
机构:
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
DELAHOY, AE
MILANO, RA
论文数:
0
引用数:
0
h-index:
0
机构:
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
MILANO, RA
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(09)
: 3913
-
3915
[2]
ANODIC OXIDATION OF SILICON - EFFECTS OF WATER ON OXIDE PROPERTIES
NANNONI, R
论文数:
0
引用数:
0
h-index:
0
NANNONI, R
MUSSELIN, MJ
论文数:
0
引用数:
0
h-index:
0
MUSSELIN, MJ
[J].
THIN SOLID FILMS,
1970,
6
(06)
: 397
-
&
[3]
SHEVENOCK S, 1975, P INT ELECTRON DEVIC, P211
[4]
15PERCENT EFFICIENT ANTIREFLECTION-COATED METAL-OXIDE-SEMICONDUCTOR SOLAR CELL
STIRN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
STIRN, RJ
YEH, YCM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
YEH, YCM
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(02)
: 95
-
98
[5]
VANARKEL AE, 1961, MOLECULES CRYSTALS, P495
[6]
INVESTIGATION OF INFLUENCE OF LOW-TEMPERATURE ANNEALING TREATMENTS ON INTERFACE STATE DENSITY AT SI-SIO2 INTERFACE
YEOW, YT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
YEOW, YT
LAMB, DR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
LAMB, DR
BROTHERTON, SD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
BROTHERTON, SD
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1975,
8
(13)
: 1495
-
&
←
1
→
共 6 条
[1]
8 PERCENT EFFICIENT LAYERED SCHOTTKY-BARRIER SOLAR CELL
ANDERSON, WA
论文数:
0
引用数:
0
h-index:
0
机构:
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
ANDERSON, WA
DELAHOY, AE
论文数:
0
引用数:
0
h-index:
0
机构:
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
DELAHOY, AE
MILANO, RA
论文数:
0
引用数:
0
h-index:
0
机构:
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
RUTGERS STATE UNIV, ELECT ENGN DEPT, NEW BRUNSWICK, NJ 08903 USA
MILANO, RA
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(09)
: 3913
-
3915
[2]
ANODIC OXIDATION OF SILICON - EFFECTS OF WATER ON OXIDE PROPERTIES
NANNONI, R
论文数:
0
引用数:
0
h-index:
0
NANNONI, R
MUSSELIN, MJ
论文数:
0
引用数:
0
h-index:
0
MUSSELIN, MJ
[J].
THIN SOLID FILMS,
1970,
6
(06)
: 397
-
&
[3]
SHEVENOCK S, 1975, P INT ELECTRON DEVIC, P211
[4]
15PERCENT EFFICIENT ANTIREFLECTION-COATED METAL-OXIDE-SEMICONDUCTOR SOLAR CELL
STIRN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
STIRN, RJ
YEH, YCM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
CALTECH,JET PROPULSION LAB,PASADENA,CA 91103
YEH, YCM
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(02)
: 95
-
98
[5]
VANARKEL AE, 1961, MOLECULES CRYSTALS, P495
[6]
INVESTIGATION OF INFLUENCE OF LOW-TEMPERATURE ANNEALING TREATMENTS ON INTERFACE STATE DENSITY AT SI-SIO2 INTERFACE
YEOW, YT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
YEOW, YT
LAMB, DR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
LAMB, DR
BROTHERTON, SD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
UNIV SOUTHAMPTON,DEPT ELECTR,SOUTHAMPTON SO9 5NH,ENGLAND
BROTHERTON, SD
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1975,
8
(13)
: 1495
-
&
←
1
→