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DIFFUSION LENGTH OF MOLES IN N-INP
被引:24
作者
:
DIADIUK, V
论文数:
0
引用数:
0
h-index:
0
DIADIUK, V
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
GROVES, SH
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
ARMIENTO, CA
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
HURWITZ, CE
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1983年
/ 42卷
/ 10期
关键词
:
D O I
:
10.1063/1.93778
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:892 / 894
页数:3
相关论文
共 14 条
[1]
ALAM MK, 1981, SOLID STATE ELECTRON, V24, P17
[2]
EVIDENCE FOR LOW SURFACE RECOMBINATION VELOCITY ON N-TYPE INP
CASEY, HC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CASEY, HC
BUEHLER, E
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUEHLER, E
[J].
APPLIED PHYSICS LETTERS,
1977,
30
(05)
: 247
-
249
[3]
LOW DARK-CURRENT, HIGH-GAIN GAINAS-INP AVALANCHE PHOTODETECTORS
DIADIUK, V
论文数:
0
引用数:
0
h-index:
0
DIADIUK, V
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
GROVES, SH
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
HURWITZ, CE
ISELER, GW
论文数:
0
引用数:
0
h-index:
0
ISELER, GW
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1981,
17
(02)
: 260
-
264
[4]
SURFACE PASSIVATION TECHNIQUES FOR INP AND INGAASP P-N-JUNCTION STRUCTURES
DIADIUK, V
论文数:
0
引用数:
0
h-index:
0
DIADIUK, V
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
GROVES, SH
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
HURWITZ, CE
[J].
ELECTRON DEVICE LETTERS,
1980,
1
(09):
: 177
-
178
[5]
EXCESS-NOISE AND RECEIVER SENSITIVITY MEASUREMENTS OF IN0.53GA0.47AS-INP AVALANCHE PHOTO-DIODES
FORREST, SR
论文数:
0
引用数:
0
h-index:
0
FORREST, SR
WILLIAMS, GF
论文数:
0
引用数:
0
h-index:
0
WILLIAMS, GF
KIM, OK
论文数:
0
引用数:
0
h-index:
0
KIM, OK
SMITH, RG
论文数:
0
引用数:
0
h-index:
0
SMITH, RG
[J].
ELECTRONICS LETTERS,
1981,
17
(24)
: 917
-
919
[6]
GEORGES A, 1980, SCANNING ELECTRON MI, V4, P69
[7]
APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS
JASTRZEBSKI, L
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
JASTRZEBSKI, L
LAGOWSKI, J
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
LAGOWSKI, J
GATOS, HC
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
GATOS, HC
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(10)
: 537
-
539
[8]
DETERMINATION OF MINORITY-CARRIER DIFFUSION LENGTH IN INDIUM-PHOSPHIDE BY SURFACE PHOTOVOLTAGE MEASUREMENT
LI, SS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611
UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611
LI, SS
[J].
APPLIED PHYSICS LETTERS,
1976,
29
(02)
: 126
-
127
[9]
INGAASP HETEROSTRUCTURE AVALANCHE PHOTO-DIODES WITH HIGH AVALANCHE GAIN
NISHIDA, K
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratories, Nippon Electric Co. Ltd., Miyazaki, Takatsuku, Kawasaki
NISHIDA, K
TAGUCHI, K
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratories, Nippon Electric Co. Ltd., Miyazaki, Takatsuku, Kawasaki
TAGUCHI, K
MATSUMOTO, Y
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratories, Nippon Electric Co. Ltd., Miyazaki, Takatsuku, Kawasaki
MATSUMOTO, Y
[J].
APPLIED PHYSICS LETTERS,
1979,
35
(03)
: 251
-
253
[10]
DIFFUSION LENGTH DETERMINATION IN THIN-FILM CUXS-CDS SOLAR-CELLS BY SCANNING ELECTRON-MICROSCOPY
OAKES, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
OAKES, JJ
GREENFIELD, IG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
GREENFIELD, IG
PARTAIN, LD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
PARTAIN, LD
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(06)
: 2548
-
2555
←
1
2
→
共 14 条
[1]
ALAM MK, 1981, SOLID STATE ELECTRON, V24, P17
[2]
EVIDENCE FOR LOW SURFACE RECOMBINATION VELOCITY ON N-TYPE INP
CASEY, HC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CASEY, HC
BUEHLER, E
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUEHLER, E
[J].
APPLIED PHYSICS LETTERS,
1977,
30
(05)
: 247
-
249
[3]
LOW DARK-CURRENT, HIGH-GAIN GAINAS-INP AVALANCHE PHOTODETECTORS
DIADIUK, V
论文数:
0
引用数:
0
h-index:
0
DIADIUK, V
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
GROVES, SH
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
HURWITZ, CE
ISELER, GW
论文数:
0
引用数:
0
h-index:
0
ISELER, GW
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1981,
17
(02)
: 260
-
264
[4]
SURFACE PASSIVATION TECHNIQUES FOR INP AND INGAASP P-N-JUNCTION STRUCTURES
DIADIUK, V
论文数:
0
引用数:
0
h-index:
0
DIADIUK, V
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
GROVES, SH
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
HURWITZ, CE
[J].
ELECTRON DEVICE LETTERS,
1980,
1
(09):
: 177
-
178
[5]
EXCESS-NOISE AND RECEIVER SENSITIVITY MEASUREMENTS OF IN0.53GA0.47AS-INP AVALANCHE PHOTO-DIODES
FORREST, SR
论文数:
0
引用数:
0
h-index:
0
FORREST, SR
WILLIAMS, GF
论文数:
0
引用数:
0
h-index:
0
WILLIAMS, GF
KIM, OK
论文数:
0
引用数:
0
h-index:
0
KIM, OK
SMITH, RG
论文数:
0
引用数:
0
h-index:
0
SMITH, RG
[J].
ELECTRONICS LETTERS,
1981,
17
(24)
: 917
-
919
[6]
GEORGES A, 1980, SCANNING ELECTRON MI, V4, P69
[7]
APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS
JASTRZEBSKI, L
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
JASTRZEBSKI, L
LAGOWSKI, J
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
LAGOWSKI, J
GATOS, HC
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
GATOS, HC
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(10)
: 537
-
539
[8]
DETERMINATION OF MINORITY-CARRIER DIFFUSION LENGTH IN INDIUM-PHOSPHIDE BY SURFACE PHOTOVOLTAGE MEASUREMENT
LI, SS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611
UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611
LI, SS
[J].
APPLIED PHYSICS LETTERS,
1976,
29
(02)
: 126
-
127
[9]
INGAASP HETEROSTRUCTURE AVALANCHE PHOTO-DIODES WITH HIGH AVALANCHE GAIN
NISHIDA, K
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratories, Nippon Electric Co. Ltd., Miyazaki, Takatsuku, Kawasaki
NISHIDA, K
TAGUCHI, K
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratories, Nippon Electric Co. Ltd., Miyazaki, Takatsuku, Kawasaki
TAGUCHI, K
MATSUMOTO, Y
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratories, Nippon Electric Co. Ltd., Miyazaki, Takatsuku, Kawasaki
MATSUMOTO, Y
[J].
APPLIED PHYSICS LETTERS,
1979,
35
(03)
: 251
-
253
[10]
DIFFUSION LENGTH DETERMINATION IN THIN-FILM CUXS-CDS SOLAR-CELLS BY SCANNING ELECTRON-MICROSCOPY
OAKES, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
OAKES, JJ
GREENFIELD, IG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
GREENFIELD, IG
PARTAIN, LD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
UNIV DELAWARE,COLL ENGN,NEWARK,DE 19711
PARTAIN, LD
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(06)
: 2548
-
2555
←
1
2
→