FACTOR-ANALYSIS OF FEM2,3VV SPECTRA OF OXIDIZING IRON - THE ROLE OF THE BACKGROUND IN THE EMERGENCE OF GHOST COMPONENTS

被引:20
作者
KOOI, BJ [1 ]
SOMERS, MAJ [1 ]
机构
[1] DELFT UNIV TECHNOL, MAT SCI LAB, ROTTERDAMSEWEG 37, 2628 AL DELFT, NETHERLANDS
关键词
D O I
10.1002/sia.740210802
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The influence of the (correction for the) background in AES spectra on the results of factor analysis (FA) was investigated. To this purpose a set of experimental spectra for the Fe M2,3 VV transition, obtained on the oxidation of pure iron, and sets of look-alike simulated spectra, using a linear combination of two elastic components superimposed on background components, were analysed with FA after different types of treatment of the spectra prior to FA, e.g. differentiation or removal of a particular type of background. In the sets of simulated spectra the roles of a background due to the secondary electron cascade and that due to the inelastically scattered electrons were investigated separately. It was observed that for both types of backgrounds additional principal components with respect to the two elastic components arise, irrespective of the considered treatment of the spectra prior to FA. Results obtained for the experimental set and for the simulated sets with a background originating from the secondary electron cascade were very similar. In the simulated spectra, the origin of the additional components could be identified unambiguously as (an inadequate correction for) the background due to the secondary electron cascade. It is likely that the same origin applies to the additional (third) component emerging on FA of the set of experimental Fe M2,3VV spectra.
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页码:501 / 513
页数:13
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共 32 条
[1]  
ATZRODT V, 1984, PHYS STATUS SOLIDI A, V82, P373, DOI 10.1002/pssa.2210820205
[2]   CHEMICAL INFORMATION OBTAINED FROM AUGER DEPTH PROFILES BY MEANS OF ADVANCED FACTOR-ANALYSIS (MLCFA) [J].
DEVOLDER, P ;
HOOGEWIJS, R ;
DEGRYSE, R ;
FIERMANS, L ;
VENNIK, J .
APPLIED SURFACE SCIENCE, 1993, 64 (01) :41-57
[3]   MAXIMUM-LIKELIHOOD COMMON FACTOR-ANALYSIS IN AUGER-ELECTRON SPECTROSCOPY [J].
DEVOLDER, P ;
HOOGEWIJS, R ;
DEGRYSE, R ;
FIERMANS, L ;
VENNIK, J .
SURFACE AND INTERFACE ANALYSIS, 1991, 17 (06) :363-372
[4]   PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J].
GAARENSTROOM, SW .
APPLIED SURFACE SCIENCE, 1981, 7 (1-2) :7-18
[5]   APPLICATION OF AUGER LINE-SHAPES AND FACTOR-ANALYSIS TO CHARACTERIZE A METAL-CERAMIC INTERFACIAL REACTION [J].
GAARENSTROOM, SW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03) :458-461
[6]   APPLICATION OF FACTOR-ANALYSIS TO AUGER CRATER-EDGE PROFILING [J].
GATTS, C ;
LOSCH, W .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (06) :2982-2985
[7]   SEPARATION OF SPECTRAL COMPONENTS AND DEPTH PROFILING THROUGH INELASTIC BACKGROUND ANALYSIS OF XPS SPECTRA WITH OVERLAPPING PEAKS [J].
HANSEN, HS ;
TOUGAARD, S .
SURFACE AND INTERFACE ANALYSIS, 1991, 17 (08) :593-607
[8]   FACTOR-ANALYSIS AND SUPERPOSITION OF AUGER-ELECTRON SPECTRA APPLIED TO ROOM-TEMPERATURE OXIDATION OF NI AND NICR21FE12 [J].
HOFMANN, S ;
STEFFEN, J .
SURFACE AND INTERFACE ANALYSIS, 1989, 14 (1-2) :59-65
[9]   INFLUENCE OF THE INELASTIC BACKGROUND ON THE ACCURACY OF FACTOR-ANALYSIS OF ELECTRON-SPECTRA [J].
JANSSON, C ;
TOUGAARD, S .
SURFACE AND INTERFACE ANALYSIS, 1990, 16 (1-12) :173-177
[10]   ENERGY-DISTRIBUTION OF PRIMARY BACKSCATTERED ELECTRONS IN AUGER-ELECTRON SPECTROSCOPY [J].
JOUSSET, D ;
LANGERON, JP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :989-995