PHASE OBJECT MICROSCOPY USING MOIRE DEFLECTOMETRY

被引:14
作者
KRASINSKI, J
HELLER, DF
KAFRI, O
机构
来源
APPLIED OPTICS | 1985年 / 24卷 / 18期
关键词
D O I
10.1364/AO.24.003032
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:3032 / 3036
页数:5
相关论文
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