MICROFIELDS IN STROBOSCOPIC VOLTAGE MEASUREMENTS VIA ELECTRON-EMISSION .1. RESPONSE FUNCTION OF THE POTENTIAL-ENERGY

[1] HIGH-SPEED CIRCUIT MEASUREMENTS USING PHOTOEMISSION SAMPLING [J]. APPLIED PHYSICS LETTERS, 1986, 49 (04) : 226 - 228

[2] CLAUBERG R, 1986, SPRINGER SERIES ELEC, V22, P200

[3] ANALYSIS OF THE TRANSIT-TIME EFFECT ON THE STROBOSCOPIC VOLTAGE CONTRAST IN THE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1985, 18 (06) : 1019 - 1027

[4] Garth S. C. J., 1985, Microelectronic Engineering, V3, P183, DOI 10.1016/0167-9317(85)90027-9

[5] HIGH-SPEED ELECTRICAL SAMPLING BY FS PHOTOEMISSION [J]. APPLIED PHYSICS LETTERS, 1986, 49 (06) : 357 - 359

[6] MENZEL E, 1983, SCANNING, V5, P105

[7] Munro E., 1980, Microcircuit engineering, P513

[8] MUNRO E, 1977, RC6411 IBM RES REP

[1] HIGH-SPEED CIRCUIT MEASUREMENTS USING PHOTOEMISSION SAMPLING [J]. APPLIED PHYSICS LETTERS, 1986, 49 (04) : 226 - 228

[2] CLAUBERG R, 1986, SPRINGER SERIES ELEC, V22, P200

[3] ANALYSIS OF THE TRANSIT-TIME EFFECT ON THE STROBOSCOPIC VOLTAGE CONTRAST IN THE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1985, 18 (06) : 1019 - 1027

[4] Garth S. C. J., 1985, Microelectronic Engineering, V3, P183, DOI 10.1016/0167-9317(85)90027-9

[5] HIGH-SPEED ELECTRICAL SAMPLING BY FS PHOTOEMISSION [J]. APPLIED PHYSICS LETTERS, 1986, 49 (06) : 357 - 359

[6] MENZEL E, 1983, SCANNING, V5, P105

[7] Munro E., 1980, Microcircuit engineering, P513

[8] MUNRO E, 1977, RC6411 IBM RES REP