HIGH-SPEED CIRCUIT MEASUREMENTS USING PHOTOEMISSION SAMPLING

被引：28

作者：

BOKOR, J

JOHNSON, AM

STORZ, RH

SIMPSON, WM

机构：

来源：

APPLIED PHYSICS LETTERS | 1986年 / 49卷 / 04期

关键词：

D O I：

10.1063/1.97179

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：226 / 228

页数：3

共 15 条

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[3]

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[8]

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[9]

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[10] ELECTROOPTIC SAMPLING IN GAAS INTEGRATED-CIRCUITS [J].

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IEEE JOURNAL OF QUANTUM ELECTRONICS, 1986, 22 (01) :79-93

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