WAVEFORM MEASUREMENTS ON GIGAHERTZ SEMICONDUCTOR-DEVICES BY SCANNING ELECTRON-MICROSCOPE STROBOSCOPY

被引：10

作者：

FUJIOKA, H

URA, K

机构：

来源：

APPLIED PHYSICS LETTERS | 1981年 / 39卷 / 01期

关键词：

D O I：

10.1063/1.92524

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：81 / 82

页数：2

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[1] QUANTITATIVE MEASUREMENT WITH HIGH TIME RESOLUTION OF INTERNAL WAVEFORMS ON MOS RAMS USING A MODIFIED SCANNING ELECTRON-MICROSCOPE
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[4] HIGH-RESOLUTION SAMPLING SEM FOR QUANTITATIVE INVESTIGATIONS OF SEMICONDUCTOR-DEVICES AND INTEGRATED-CIRCUITS
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[6] 2-DIMENSIONAL OBSERVATION OF GUNN DOMAINS AT 1 GHZ BY PICOSECOND PULSE STROBOSCOPIC SEM
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[7] ANALYSIS OF THE HIGH-FIELD DOMAIN DYNAMICS IN A PLANAR GUNN DIODE BY USING A STROBOSCOPIC SEM
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[J]. APPLIED PHYSICS LETTERS, 1978, 33 (10) : 888 - 889
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[J]. MICROELECTRONICS AND RELIABILITY, 1971, 10 (05): : 317 - &