学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
2-DIMENSIONAL OBSERVATION OF GUNN DOMAINS AT 1 GHZ BY PICOSECOND PULSE STROBOSCOPIC SEM
被引:12
作者
:
HOSOKAWA, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,SUITA,OSAKA 565,JAPAN
OSAKA UNIV,FAC ENGN,SUITA,OSAKA 565,JAPAN
HOSOKAWA, T
[
1
]
FUJIOKA, H
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,SUITA,OSAKA 565,JAPAN
OSAKA UNIV,FAC ENGN,SUITA,OSAKA 565,JAPAN
FUJIOKA, H
[
1
]
URA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,SUITA,OSAKA 565,JAPAN
OSAKA UNIV,FAC ENGN,SUITA,OSAKA 565,JAPAN
URA, K
[
1
]
机构
:
[1]
OSAKA UNIV,FAC ENGN,SUITA,OSAKA 565,JAPAN
来源
:
APPLIED PHYSICS LETTERS
|
1977年
/ 31卷
/ 05期
关键词
:
D O I
:
10.1063/1.89691
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:340 / 340
页数:1
相关论文
共 4 条
[1]
ULTRA-HIGH FREQUENCY BEAM ANALYZER
BLOOM, LR
论文数:
0
引用数:
0
h-index:
0
BLOOM, LR
VONFOERSTER, HM
论文数:
0
引用数:
0
h-index:
0
VONFOERSTER, HM
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1954,
25
(07)
: 649
-
653
[2]
TECHNIQUE FOR STUDY OF GUNN DEVICES AT 9.1 GHZ USING A SCANNING ELECTRON-MICROSCOPE
GOPINATH, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
GOPINATH, A
HILL, MS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
HILL, MS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1973,
ED20
(07)
: 610
-
612
[3]
TIME-RESOLVED SCANNING ELECTRON MICROSCOPY AND ITS APPLICATION TO BULK-EFFECT OSCILLATORS
MACDONALD, NC
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley
MACDONALD, NC
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley
ROBINSON, GY
WHITE, RM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley
WHITE, RM
[J].
JOURNAL OF APPLIED PHYSICS,
1969,
40
(11)
: 4516
-
+
[4]
STROBOSCOPIC SCANNING ELECTRON MICROSCOPY
PLOWS, GS
论文数:
0
引用数:
0
h-index:
0
PLOWS, GS
NIXON, WC
论文数:
0
引用数:
0
h-index:
0
NIXON, WC
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1968,
1
(06):
: 595
-
&
←
1
→
共 4 条
[1]
ULTRA-HIGH FREQUENCY BEAM ANALYZER
BLOOM, LR
论文数:
0
引用数:
0
h-index:
0
BLOOM, LR
VONFOERSTER, HM
论文数:
0
引用数:
0
h-index:
0
VONFOERSTER, HM
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1954,
25
(07)
: 649
-
653
[2]
TECHNIQUE FOR STUDY OF GUNN DEVICES AT 9.1 GHZ USING A SCANNING ELECTRON-MICROSCOPE
GOPINATH, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
GOPINATH, A
HILL, MS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,CAERNARVONSHIRE,WALES
HILL, MS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1973,
ED20
(07)
: 610
-
612
[3]
TIME-RESOLVED SCANNING ELECTRON MICROSCOPY AND ITS APPLICATION TO BULK-EFFECT OSCILLATORS
MACDONALD, NC
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley
MACDONALD, NC
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley
ROBINSON, GY
WHITE, RM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley
WHITE, RM
[J].
JOURNAL OF APPLIED PHYSICS,
1969,
40
(11)
: 4516
-
+
[4]
STROBOSCOPIC SCANNING ELECTRON MICROSCOPY
PLOWS, GS
论文数:
0
引用数:
0
h-index:
0
PLOWS, GS
NIXON, WC
论文数:
0
引用数:
0
h-index:
0
NIXON, WC
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1968,
1
(06):
: 595
-
&
←
1
→