FUNCTION TESTING OF BIPOLAR ICS AND LSIS WITH THE STROBOSCOPIC SCANNING ELECTRON-MICROSCOPE

被引：33

作者：

FUJIOKA, H

NAKAMAE, K

URA, K

机构：

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1980年 / 15卷 / 02期

关键词：

D O I：

10.1109/JSSC.1980.1051360

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：177 / 183

页数：7

相关论文

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