GIGAHERTZ STROBOSCOPY WITH SCANNING ELECTRON-MICROSCOPE

被引：24

作者：

HOSOKAWA, T

FUJIOKA, H

URA, K

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1978年 / 49卷 / 09期

关键词：

D O I：

10.1063/1.1135571

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1293 / 1299

页数：7

共 13 条

[1]

BALK LJ, 1976, SCANNING ELECTRON MI, V1, P615

[2] VOLTAGE DISTRIBUTIONS IN X-BAND N+-N-N+ GUNN DEVICES USING A SEM [J].

FENTEM, PJ ;

GOPINATH, A .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (10) :1159-1165

[3]

FUJIOKA H, 1978, SCANNING ELECTRON MI, V1, P755

[4] TECHNIQUE FOR STUDY OF GUNN DEVICES AT 9.1 GHZ USING A SCANNING ELECTRON-MICROSCOPE [J].

GOPINATH, A ;

HILL, MS .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (07) :610-612

[5] PROBING GUNN DOMAINS AT X-BAND MICROWAVE-FREQUENCIES USING A SCANNING MICROSCOPE [J].

HILL, MS ;

GOPINATH, A .

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[6] GENERATION AND MEASUREMENT OF SUBPICOSECOND ELECTRON-BEAM PULSES [J].

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URA, K .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (05) :624-628

[7] 2-DIMENSIONAL OBSERVATION OF GUNN DOMAINS AT 1 GHZ BY PICOSECOND PULSE STROBOSCOPIC SEM [J].

HOSOKAWA, T ;

FUJIOKA, H ;

URA, K .

APPLIED PHYSICS LETTERS, 1977, 31 (05) :340-340

[8] TIME-RESOLVED SCANNING ELECTRON MICROSCOPY AND ITS APPLICATION TO BULK-EFFECT OSCILLATORS [J].

MACDONALD, NC ;

ROBINSON, GY ;

WHITE, RM .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (11) :4516-+

[9] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J].

PLOWS, GS ;

NIXON, WC .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06) :595-&

[10] PROBING OF GUNN EFFECT DOMAINS WITH A SCANNING ELECTRON MICROSCOPE [J].

ROBINSON, GY ;

WHITE, RM ;

MACDONALD, NC .

APPLIED PHYSICS LETTERS, 1968, 13 (12) :407-+

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