GENERATION AND MEASUREMENT OF SUBPICOSECOND ELECTRON-BEAM PULSES

[1] ULTRA-HIGH FREQUENCY BEAM ANALYZER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1954, 25 (07) : 649 - 653

[2] ELECTRON BUNCHES OF SHORT TIME DURATION [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (05) : 674 - 675

[3] TIME DISPERSION OF SECONDARY ELECTRON EMISSION [J]. JOURNAL OF APPLIED PHYSICS, 1955, 26 (06) : 781 - 782

[4] FUJIOKA H, 1972, T IECE JPN B, V55, P463

[5] FUJISAWA K, 1953, T IECE JPN, V36, P613

[6] TECHNIQUE FOR STUDY OF GUNN DEVICES AT 9.1 GHZ USING A SCANNING ELECTRON-MICROSCOPE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (07) : 610 - 612

[7] 2-DIMENSIONAL OBSERVATION OF GUNN DOMAINS AT 1 GHZ BY PICOSECOND PULSE STROBOSCOPIC SEM [J]. APPLIED PHYSICS LETTERS, 1977, 31 (05) : 340 - 340

[8] HOSOKAWA T, 1977, T IECE JAPAN B, V60, P55

[9] MORIMURA N, 1973, T IECE JPN B, V56, P72

[10] RECKNAGEL A, 1938, Z PHYS, V3, P61

[1] ULTRA-HIGH FREQUENCY BEAM ANALYZER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1954, 25 (07) : 649 - 653

[2] ELECTRON BUNCHES OF SHORT TIME DURATION [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (05) : 674 - 675

[3] TIME DISPERSION OF SECONDARY ELECTRON EMISSION [J]. JOURNAL OF APPLIED PHYSICS, 1955, 26 (06) : 781 - 782

[4] FUJIOKA H, 1972, T IECE JPN B, V55, P463

[5] FUJISAWA K, 1953, T IECE JPN, V36, P613

[6] TECHNIQUE FOR STUDY OF GUNN DEVICES AT 9.1 GHZ USING A SCANNING ELECTRON-MICROSCOPE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (07) : 610 - 612

[7] 2-DIMENSIONAL OBSERVATION OF GUNN DOMAINS AT 1 GHZ BY PICOSECOND PULSE STROBOSCOPIC SEM [J]. APPLIED PHYSICS LETTERS, 1977, 31 (05) : 340 - 340

[8] HOSOKAWA T, 1977, T IECE JAPAN B, V60, P55

[9] MORIMURA N, 1973, T IECE JPN B, V56, P72

[10] RECKNAGEL A, 1938, Z PHYS, V3, P61