TECHNIQUE FOR LINEARIZATION OF VOLTAGE CONTRAST IN SCANNING ELECTRON MICROSCOPE

[1] BANBURY JR, 1970, 3RD P ANN SEM S CHIC, P473

[2] FLEMING JP, 1970, 3 P ANN SEM S CHIC, P465

[3] JOY DC, 1970, 7 P INT C EL MICR GR, V1, P221

[4] MacDonald N. C., 1970, Applied Physics Letters, V16, P76, DOI 10.1063/1.1653107

[5] Oatley C.W., 1957, J ELECTRON CONTR, V2, P568

[6] ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 742 - &

[7] VOLTAGE MEASUREMENT IN SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (09): : 902 - &

[1] BANBURY JR, 1970, 3RD P ANN SEM S CHIC, P473

[2] FLEMING JP, 1970, 3 P ANN SEM S CHIC, P465

[3] JOY DC, 1970, 7 P INT C EL MICR GR, V1, P221

[4] MacDonald N. C., 1970, Applied Physics Letters, V16, P76, DOI 10.1063/1.1653107

[5] Oatley C.W., 1957, J ELECTRON CONTR, V2, P568

[6] ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 742 - &

[7] VOLTAGE MEASUREMENT IN SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (09): : 902 - &