SHEARING INTERFEROMETER FOR PHASE-SHIFTING INTERFEROMETRY WITH POLARIZATION PHASE-SHIFTER

被引：111

作者：

KOTHIYAL, MP

DELISLE, C

机构：

来源：

APPLIED OPTICS | 1985年 / 24卷 / 24期

关键词：

D O I：

10.1364/AO.24.004439

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：4439 / 4442

页数：4

共 11 条

[1]

Bruning J.H., 1978, OPTICAL SHOP TESTING

[2] 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J].

CHENG, YY ;

WYANT, JC .

APPLIED OPTICS, 1984, 23 (24) :4539-4543

[3] MEASUREMENT OF ASPHERIC SURFACES USING A MICROCOMPUTER-CONTROLLED DIGITAL RADIAL-SHEAR INTERFEROMETER [J].

HARIHARAN, P ;

OREB, BF ;

ZHOU, WZ .

OPTICA ACTA, 1984, 31 (09) :989-999

[4] POLARIZATION HETERODYNE INTERFEROMETRY USING A SIMPLE ROTATING ANALYZER .1. THEORY AND ERROR ANALYSIS [J].

HONG, ZH .

APPLIED OPTICS, 1983, 22 (13) :2052-2056

[5] ROTATING ANALYZER HETERODYNE INTERFEROMETER - ERROR ANALYSIS [J].

KOTHIYAL, MP ;

DELISLE, C .

APPLIED OPTICS, 1985, 24 (15) :2288-2290

[6]

KOTHIYAL MP, UNPUB OPT ACTA

[7]

Malacara D., 1978, OPTICAL SHOP TESTING

[8] OPTICAL FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETERS USING MULTIPLE ROTATING POLARIZATION RETARDERS [J].

SHAGAM, RN ;

WYANT, JC .

APPLIED OPTICS, 1978, 17 (19) :3034-3035

[9] UP-DOWN FREQUENCY SHIFTER FOR OPTICAL HETERODYNE INTERFEROMETRY [J].

SOMMARGREN, GE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (08) :960-961

[10] FRINGE SCANNING RONCHI TEST FOR ASPHERICAL SURFACES [J].

YATAGAI, T .

APPLIED OPTICS, 1984, 23 (20) :3676-3679

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