ION-BEAM-INDUCED EFFECTS IN SECONDARY ION MASS-SPECTROMETRY OF INORGANIC SALTS

[1] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[2] BENNINGHOVEN A, 1979, SPRINGER SERIES CHEM, V9, P116

[3] SECONDARY ION MASS-SPECTROMETRY OF INORGANIC SALTS - NITRITES-NITRATES [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 38 (01): : 11 - 19

[4] DEPAUW E, 1979, 2ND INT C SEC ION MA

[5] DEPAUW E, 1979, SPRINGER SERIES CHEM, V9, P139

[6] SIMS MOLECULAR CLUSTER INTENSITIES OF INORGANIC SALTS CONTAINING SULFUR AND NITROGEN OXYANIONS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 37 (01): : 49 - 65

[7] KELLY R, 1975, RADIAT EFF, V25, P1

[8] MARIEN J, 1979, B SOC CHIM BELG, V88, P115

[9] OECHSNER H, 1981, 3RD INT C SEC ION MA

[10] ESCA INVESTIGATIONS OF ION-BEAM EFFECTS ON SURFACES [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 16 (03) : 183 - 193

[1] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[2] BENNINGHOVEN A, 1979, SPRINGER SERIES CHEM, V9, P116

[3] SECONDARY ION MASS-SPECTROMETRY OF INORGANIC SALTS - NITRITES-NITRATES [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 38 (01): : 11 - 19

[4] DEPAUW E, 1979, 2ND INT C SEC ION MA

[5] DEPAUW E, 1979, SPRINGER SERIES CHEM, V9, P139

[6] SIMS MOLECULAR CLUSTER INTENSITIES OF INORGANIC SALTS CONTAINING SULFUR AND NITROGEN OXYANIONS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 37 (01): : 49 - 65

[7] KELLY R, 1975, RADIAT EFF, V25, P1

[8] MARIEN J, 1979, B SOC CHIM BELG, V88, P115

[9] OECHSNER H, 1981, 3RD INT C SEC ION MA

[10] ESCA INVESTIGATIONS OF ION-BEAM EFFECTS ON SURFACES [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 16 (03) : 183 - 193