OBSERVATION OF LATCH-UP PHENOMENA IN CMOS ICS BY MEANS OF DIGITAL DIFFERENTIAL VOLTAGE CONTRAST

被引：7

作者：

FANTINI, F

VANZI, M

MORANDI, C

ZANONI, E

机构：

[1] UNIV BARI,DEPT ELECTR ENGN,I-70124 BARI,ITALY

[2] CTR STUDIE APPLICAZ TECHNOL AVANZATE,BARI,ITALY

[3] UNIV ANCONA,DEA,I-60100 ANCONA,ITALY

[4] UNIV MODENA,DEPT FIS,I-41100 MODENA,ITALY

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1986年 / 21卷 / 01期

关键词：

D O I：

10.1109/JSSC.1986.1052494

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：169 / 174

页数：6

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