ANALYSIS OF SEMITRANSPARENT LAYERED MATERIALS BY MODULATED PHOTOTHERMAL RADIOMETRY - APPLICATION TO THE BONDING AND THICKNESS CONTROL OF ENAMEL COATINGS

被引：10

作者：

EGEE, M ^{[1
]}

DARTOIS, R ^{[1
]}

MARX, J ^{[1
]}

BISSIEUX, C ^{[1
]}

机构：

[1] FAC SCI REIMS,RECH OPT LAB,F-51062 REIMS,FRANCE

来源：

CANADIAN JOURNAL OF PHYSICS | 1986年 / 64卷 / 09期

关键词：

D O I：

10.1139/p86-226

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1297 / 1302

页数：6

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