ANALYSIS OF SEMITRANSPARENT LAYERED MATERIALS BY MODULATED PHOTOTHERMAL RADIOMETRY - APPLICATION TO THE BONDING AND THICKNESS CONTROL OF ENAMEL COATINGS

被引:10
作者
EGEE, M [1 ]
DARTOIS, R [1 ]
MARX, J [1 ]
BISSIEUX, C [1 ]
机构
[1] FAC SCI REIMS,RECH OPT LAB,F-51062 REIMS,FRANCE
关键词
D O I
10.1139/p86-226
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1297 / 1302
页数:6
相关论文
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