MICROMORPHOLOGY STUDY OF MERCURIC IODIDE-CRYSTALS BY ATOMIC-FORCE MICROSCOPY

被引：6

作者：

AZOULAY, M ^{[1
]}

GEORGE, MA ^{[1
]}

JAYATIRTHA, HN ^{[1
]}

BIAO, Y ^{[1
]}

BURGER, A ^{[1
]}

SILBERMAN, E ^{[1
]}

NASON, D ^{[1
]}

机构：

[1] EG&G ENERGY MEASUREMENTS INC,SANTA BARBARA OPERAT,GOLETA,CA 93117

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 05期

关键词：

D O I：

10.1116/1.586478

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Atomic force microscopy was used to study the surfaces of mercuric iodide crystals at ambient. Various surface conditions were examined, including as-grown (001), (110), and (013) faces, and cleaved, chemically etched, vacuum etched, and aged (001) surfaces. As-grown (001) faces show a terraced structure and are smoother than as-grown (110) faces. Freshly cleaved surfaces exhibit a terraced structure, with riser heights corresponding to multiples of the c-lattice constant. All surfaces become progressively pitted and rougher by vacuum treatment or chemical etching. Defects identified as pits or hillocks with dimensions of the order of 100 nanometers were also observed, and surface roughness values were obtained for quantitative characterization of the various treatments.

引用

页码：1782 / 1787

页数：6

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