BEHAVIOR OF THICK-FILM BISRCACUO RF SQUID AT 77-K

被引：5

作者：

KHARE, N

GUPTA, AK

CHAUDHRY, S

TOMAR, VS

机构：

[1] National Physical Laboratory, New Delhi, 110012, Dr. K.S., Krishnan Road

来源：

SOLID STATE COMMUNICATIONS | 1990年 / 76卷 / 07期

关键词：

D O I：

10.1016/0038-1098(90)90886-G

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Rf SQUID effect has been observed in BiSrCaCuO thick film at 77 K. The films were prepared using screen printing technique on MgO (100) substrate with the starting composition of 1112. The superconducting film has Tc(R=0) ∼ 100 K. A hole shunted with a microbridge is carved manually for observing rf SQUID effect. Flux noise spectrum of the SQUID has been studied at 77 K. The flux noise in this device is relatively less than that observed in thick film YBaCuO rf SQUID. © 1990.

引用

页码：929 / 931

页数：3

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