BEHAVIOR OF THICK-FILM BISRCACUO RF SQUID AT 77-K

被引:5
作者
KHARE, N
GUPTA, AK
CHAUDHRY, S
TOMAR, VS
机构
[1] National Physical Laboratory, New Delhi, 110012, Dr. K.S., Krishnan Road
关键词
D O I
10.1016/0038-1098(90)90886-G
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Rf SQUID effect has been observed in BiSrCaCuO thick film at 77 K. The films were prepared using screen printing technique on MgO (100) substrate with the starting composition of 1112. The superconducting film has Tc(R=0) ∼ 100 K. A hole shunted with a microbridge is carved manually for observing rf SQUID effect. Flux noise spectrum of the SQUID has been studied at 77 K. The flux noise in this device is relatively less than that observed in thick film YBaCuO rf SQUID. © 1990.
引用
收藏
页码:929 / 931
页数:3
相关论文
共 30 条
[11]  
GUPTA AK, 1987, J PHYS, V28, pL705
[12]  
GUPTA AK, IN PRESS PRAMANA J P
[13]   2-HOLE SQUID BEHAVIOR IN A BULK YBCO SAMPLE AT 77K [J].
HARROP, S ;
MUIRHEAD, CM ;
COLCLOUGH, MS ;
GOUGH, CE .
PHYSICA C, 1988, 153 :1411-1412
[14]  
Kataria N. D., 1989, Modern Physics Letters B, V3, P519, DOI 10.1142/S0217984989000832
[15]   PREPARATION OF YBACUO THIN-FILM DC SQUID [J].
KATOH, Y ;
ASAHI, M ;
ASANO, H ;
MICHIKAMI, O .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (06) :L1110-L1112
[16]   NOISE PERFORMANCE OF A COMPOSITE HTC/NIOBIUM SQUID IN RF AND DC BIAS MODES [J].
KEENE, MN ;
HARROP, SP ;
JACKSON, TJ ;
MUIRHEAD, CM ;
GOUGH, CE .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1990, 3 (05) :263-265
[17]   EFFECT OF HEAT-TREATMENT ON AG/Y-BA-CU-O CONTACT RESISTANCE [J].
KHARE, N ;
ARORA, SK ;
REDDY, GSN ;
TOMAR, VS ;
OJHA, VN ;
KATARIA, ND ;
GUPTA, AK .
PRAMANA, 1989, 33 (02) :L333-L338
[18]  
KHARE N, IN PRESS PRAMANA J P
[19]   QUANTUM INTERFERENCE DEVICES MADE FROM SUPERCONDUCTING OXIDE THIN-FILMS [J].
KOCH, RH ;
UMBACH, CP ;
CLARK, GJ ;
CHAUDHARI, P ;
LAIBOWITZ, RB .
APPLIED PHYSICS LETTERS, 1987, 51 (03) :200-202
[20]   MAGNETOCARDIOMETER BASED ON A SINGLE-HOLE HIGH-TC SQUID [J].
LIKHACHEV, AG ;
POLUSHKIN, VN ;
UCHAIKIN, SV ;
VASILIEV, BV .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1990, 3 (03) :148-150