DEFORMATION MEASUREMENT USING HIGH-RESOLUTION MOIRE PHOTOGRAPHY

被引：19

作者：

FORNO, C

机构：

[1] NPL, Middlesex, Engl, NPL, Middlesex, Engl

来源：

OPTICS AND LASERS IN ENGINEERING | 1988年 / 8卷 / 3-4期

关键词：

DEFORMATION MEASUREMENT - HIGH RESOLUTION - MOIRE PHOTOGRAPHY - SLOTTED MASK - SPATIAL FILTERING;

D O I：

10.1016/0143-8166(88)90038-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

By installing a slotted mask inside the lens of a 35 mm camera the response can be tuned to resolve 300 lines/mm. The camera is used to record changes in fine grid patterns applied to engineering structures and by analyzing the processed negatives in a spatial filtering system, moire fringe maps are generated representing the separate x and y displacements that have occurred. Measurements have been obtained from materials ranging from concrete to soft plastics and a variety of patterns is described for treating most surfaces.

引用

页码：189 / 212

页数：24

共 11 条

[1] HIGH SENSITIVITY MOIRE GRID TECHNIQUE FOR STUDYING DEFORMATION IN LARGE OBJECTS [J].