CORRELATION BETWEEN LEWIS DONOR-ACCEPTOR PROPERTIES DETERMINED BY XPS AND BRONSTED ACID-BASE PROPERTIES DETERMINED BY REST-POTENTIAL MEASUREMENTS, FOR ALUMINUM AND SILICON-OXIDES

In order to qualify the reactivity of various aluminium and silicon oxide substrates for elastomer adhesion applications, X-ray photoelectron spectroscopy (XPS) and rest-electrochemical potential measurements have been performed on those surfaces. The interpretation of XPS binding energy shift measurements in terms of Fermi level variation from one surface to another, as proposed by Mullins and Averbach in 1988, is discussed in view of results on an aluminosilicate compound surface. The correlation with electrochemical rest-potential measurements on an anodized aluminium surface and a silane coupling agent is described and discussed. The possibility of surface reactivity assessment through correlated XPS and electrochemical measurements for metal oxides is demonstrated.