FCC TITANIUM IN TI-AL MULTILAYERS

被引：40

作者：

SHECTMAN, D

VANHEERDEN, D

JOSELL, D

机构：

[1] NIST, Gaithersburg

来源：

MATERIALS LETTERS | 1994年 / 20卷 / 5-6期

关键词：

D O I：

10.1016/0167-577X(94)90039-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin titanium films deposited on aluminum, in a multilayered form, were found to transform from a hexagonal close-packed (hcp, P63/MMC) structure to the face-centered cubic structure (fcc, FM3M) upon thinning of cross sections for TEM study. The transformation results in twinned Al and Ti layers with noncoherent SIGMA = 3 boundaries separating the twin related crystals in each layer. The as-deposited Ti is hcp and the Al fcc. The Ti layers studied varied in thickness between 30 and 500 nm. They were deposited by electron beam evaporation in vacuum, using 30 nm thick layers of Al to form multilayered films which contained between 10 and 100 bilayers. The study was conducted by TEM and X-ray diffraction and the hcp to fcc transformation of the Ti layers was observed in all the multilayers.

引用

页码：329 / 334

页数：6

共 6 条

[1]

Bickerdike R.L., 1984, INT J RAPID SOLIDIF, V1, P305

[2]

CHAUDHURI J, 1993, THIN FILMS STRESSES, V4, P707

[3] FORMATION OF FACE-CENTERED-CUBIC TITANIUM ON A NI SINGLE-CRYSTAL AND IN NI/TI MULTILAYERS [J].